XRD is a qualitative to quantitative technique used for problems ranging from the identification
of minor and clay phases to determining the anisotropic thermal expansion coefficients of novel
materials. Phases are identified using the automated search–match PDF2 database and TOPAZ, the
most widely used commercial software for whole pattern fitting; Rietveld, Pawley, and LeBail
methods; indexing; quantitative phase analysis; and ab initio structure determination. Depending
on sample preparation and composition, QPA can determine the absolute amounts of crystalline
phases down to 0.1 wt%. XRD can also identify the presence of amorphous material (glass) but
not the composition.
The system is capable of performing thin film analysis, stress analysis, and texture analysis.
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